BibTeX record conf/issre/KanstrenC14

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@inproceedings{DBLP:conf/issre/KanstrenC14,
  author    = {Teemu Kanstr{\'{e}}n and
               Marsha Chechik},
  title     = {Trace Reduction and Pattern Analysis to Assist Debugging in Model-Based
               Testing},
  booktitle = {25th {IEEE} International Symposium on Software Reliability Engineering
               Workshops, {ISSRE} Workshops, Naples, Italy, November 3-6, 2014},
  pages     = {238--243},
  year      = {2014},
  crossref  = {DBLP:conf/issre/2014w},
  url       = {https://doi.org/10.1109/ISSREW.2014.9},
  doi       = {10.1109/ISSREW.2014.9},
  timestamp = {Thu, 25 May 2017 00:43:41 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/issre/KanstrenC14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/issre/2014w,
  title     = {25th {IEEE} International Symposium on Software Reliability Engineering
               Workshops, {ISSRE} Workshops, Naples, Italy, November 3-6, 2014},
  publisher = {{IEEE} Computer Society},
  year      = {2014},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6982004},
  isbn      = {978-1-4799-7377-4},
  timestamp = {Tue, 28 Apr 2015 17:32:21 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/issre/2014w},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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