BibTeX record conf/itc/CeleiroDFST96

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@inproceedings{DBLP:conf/itc/CeleiroDFST96,
  author       = {F. Celeiro and
                  L. Dias and
                  J. Ferreira and
                  Marcelino B. Santos and
                  Jo{\~{a}}o Paulo Teixeira},
  title        = {Defect-Oriented {IC} Test and Diagnosis Using {VHDL} Fault Simulation},
  booktitle    = {Proceedings {IEEE} International Test Conference 1996, Test and Design
                  Validity, Washington, DC, USA, October 20-25, 1996},
  pages        = {620--628},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/TEST.1996.557119},
  doi          = {10.1109/TEST.1996.557119},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/CeleiroDFST96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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