BibTeX record conf/itc/DesineniDB00

download as .bib file

@inproceedings{DBLP:conf/itc/DesineniDB00,
  author       = {Rao Desineni and
                  Kumar N. Dwarakanath and
                  Ronald D. Blanton},
  title        = {Universal test generation using fault tuples},
  booktitle    = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
                  NJ, USA, October 2000},
  pages        = {812--819},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/TEST.2000.894283},
  doi          = {10.1109/TEST.2000.894283},
  timestamp    = {Thu, 23 Mar 2023 23:58:37 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DesineniDB00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.