BibTeX record conf/itc/KongPWI08

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@inproceedings{DBLP:conf/itc/KongPWI08,
  author       = {Wei Kong and
                  Paul C. Parries and
                  G. Wang and
                  Subramanian S. Iyer},
  editor       = {Douglas Young and
                  Nur A. Touba},
  title        = {Analysis of Retention Time Distribution of Embedded {DRAM} - {A} New
                  Method to Characterize Across-Chip Threshold Voltage Variation},
  booktitle    = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
                  California, USA, October 26-31, 2008},
  pages        = {1--7},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/TEST.2008.4700556},
  doi          = {10.1109/TEST.2008.4700556},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KongPWI08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}