BibTeX record conf/itc/LamoureuxA83

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@inproceedings{DBLP:conf/itc/LamoureuxA83,
  author       = {Michael G. Lamoureux and
                  Vinod K. Agarwal},
  title        = {Non-Stuck-At Fault Detection in nMOS Circuits by Region Analysis},
  booktitle    = {Proceedings International Test Conference 1983, Philadelphia, PA,
                  USA, October 1983},
  pages        = {129--137},
  publisher    = {{IEEE} Computer Society},
  year         = {1983},
  timestamp    = {Tue, 05 Nov 2002 15:16:27 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LamoureuxA83.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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