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BibTeX record conf/itc/TamPB10
@inproceedings{DBLP:conf/itc/TamPB10, author = {Wing Chiu Tam and Osei Poku and Ronald D. Blanton}, editor = {Ron Press and Erik H. Volkerink}, title = {Systematic defect identification through layout snippet clustering}, booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX, USA, November 2-4, 2010}, pages = {378--387}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/TEST.2010.5699239}, doi = {10.1109/TEST.2010.5699239}, timestamp = {Thu, 23 Mar 2023 23:58:42 +0100}, biburl = {https://dblp.org/rec/conf/itc/TamPB10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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