BibTeX record conf/itc/WangCLCHWHY03

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@inproceedings{DBLP:conf/itc/WangCLCHWHY03,
  author       = {Chih{-}Wea Wang and
                  Kuo{-}Liang Cheng and
                  Jih{-}Nung Lee and
                  Yung{-}Fa Chou and
                  Chih{-}Tsun Huang and
                  Cheng{-}Wen Wu and
                  Frank Huang and
                  Hong{-}Tzer Yang},
  title        = {Fault Pattern Oriented Defect Diagnosis for Memories},
  booktitle    = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
                  Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
                  NC, {USA}},
  pages        = {29--38},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TEST.2003.1270822},
  doi          = {10.1109/TEST.2003.1270822},
  timestamp    = {Thu, 23 Mar 2023 23:58:38 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/WangCLCHWHY03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}