BibTeX record conf/itc/WangHLLYH08

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@inproceedings{DBLP:conf/itc/WangHLLYH08,
  author       = {Fei Wang and
                  Yu Hu and
                  Huawei Li and
                  Xiaowei Li and
                  Jing Ye and
                  Yu Huang},
  editor       = {Douglas Young and
                  Nur A. Touba},
  title        = {Deterministic Diagnostic Pattern Generation {(DDPG)} for Compound
                  Defects},
  booktitle    = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
                  California, USA, October 26-31, 2008},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/TEST.2008.4700587},
  doi          = {10.1109/TEST.2008.4700587},
  timestamp    = {Mon, 22 May 2023 13:33:49 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/WangHLLYH08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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