BibTeX record conf/itc/YilmazWROSEFGC10

• > Home > conf/itc/YilmazWROSEFGC10

@inproceedings{DBLP:conf/itc/YilmazWROSEFGC10,
  author       = {Mahmut Yilmaz and
                  Baosheng Wang and
                  Jayalakshmi Rajaraman and
                  Tom Olsen and
                  Kanwaldeep Sobti and
                  Dwight Elvey and
                  Jeff Fitzgerald and
                  Grady Giles and
                  Wei{-}Yu Chen},
  editor       = {Ron Press and
                  Erik H. Volkerink},
  title        = {The scan-DFT features of AMD's next-generation microprocessor core},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
                  USA, November 2-4, 2010},
  pages        = {39--48},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/TEST.2010.5699203},
  doi          = {10.1109/TEST.2010.5699203},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/YilmazWROSEFGC10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}