BibTeX record conf/itc/YonedaHIF11

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@inproceedings{DBLP:conf/itc/YonedaHIF11,
  author    = {Tomokazu Yoneda and
               Keigo Hori and
               Michiko Inoue and
               Hideo Fujiwara},
  title     = {Faster-than-at-speed test for increased test quality and in-field
               reliability},
  booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
               USA, September 20-22, 2011},
  pages     = {1--9},
  year      = {2011},
  crossref  = {DBLP:conf/itc/2011},
  url       = {https://doi.org/10.1109/TEST.2011.6139131},
  doi       = {10.1109/TEST.2011.6139131},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/YonedaHIF11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2011,
  editor    = {Bill Eklow and
               R. D. (Shawn) Blanton},
  title     = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
               USA, September 20-22, 2011},
  publisher = {{IEEE} Computer Society},
  year      = {2011},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6132473/proceeding},
  isbn      = {978-1-4577-0153-5},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2011},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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