BibTeX record conf/latw/ReisMZBM20

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@inproceedings{DBLP:conf/latw/ReisMZBM20,
  author       = {Ricardo A. L. Reis and
                  Cristina Meinhardt and
                  Alexandra L. Zimpeck and
                  Leonardo Heitich Brendler and
                  Leonardo B. Moraes},
  title        = {Circuit Level Design Methods to Mitigate Soft Errors},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093683},
  doi          = {10.1109/LATS49555.2020.9093683},
  timestamp    = {Mon, 03 Jan 2022 22:26:07 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/ReisMZBM20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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