BibTeX record conf/mva/ShimodaISI98

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@inproceedings{DBLP:conf/mva/ShimodaISI98,
  author       = {Atsushi Shimoda and
                  Hisafumi Iwata and
                  Yukihiro Shibata and
                  Hidehiro Ikeda},
  title        = {Thin Film Magnetic Head Wafer Inspection Technique Using Geometrical
                  Feature Based Image Comparison},
  booktitle    = {Proceedings of {IAPR} Workshop on Machine Vision Applications, {MVA}
                  1998, November 17-19, 1998, Chiba, Japan},
  pages        = {531--534},
  year         = {1998},
  url          = {http://b2.cvl.iis.u-tokyo.ac.jp/mva/proceedings/CommemorativeDVD/1998/papers/1998531.pdf},
  timestamp    = {Thu, 12 Mar 2020 11:38:09 +0100},
  biburl       = {https://dblp.org/rec/conf/mva/ShimodaISI98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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