BibTeX record conf/qrs/TsudaWFYS18

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@inproceedings{DBLP:conf/qrs/TsudaWFYS18,
  author    = {Naohiko Tsuda and
               Hironori Washizaki and
               Yoshiaki Fukazawa and
               Yuichiro Yasuda and
               Shunsuke Sugimura},
  title     = {Machine Learning to Evaluate Evolvability Defects: Code Metrics Thresholds
               for a Given Context},
  booktitle = {2018 {IEEE} International Conference on Software Quality, Reliability
               and Security, {QRS} 2018, Lisbon, Portugal, July 16-20, 2018},
  pages     = {83--94},
  year      = {2018},
  crossref  = {DBLP:conf/qrs/2018},
  url       = {https://doi.org/10.1109/QRS.2018.00022},
  doi       = {10.1109/QRS.2018.00022},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/qrs/TsudaWFYS18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/qrs/2018,
  title     = {2018 {IEEE} International Conference on Software Quality, Reliability
               and Security, {QRS} 2018, Lisbon, Portugal, July 16-20, 2018},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8424855/proceeding},
  isbn      = {978-1-5386-7757-5},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/qrs/2018},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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