BibTeX record conf/vlsi/Fujita15a

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@inproceedings{DBLP:conf/vlsi/Fujita15a,
  author       = {Masahiro Fujita},
  editor       = {Youngsoo Shin and
                  Chi{-}Ying Tsui and
                  Jae{-}Joon Kim and
                  Kiyoung Choi and
                  Ricardo Reis},
  title        = {Delay Testing Based on Multiple Faulty Behaviors},
  booktitle    = {VLSI-SoC: Design for Reliability, Security, and Low Power - 23rd {IFIP}
                  {WG} 10.5/IEEE International Conference on Very Large Scale Integration,
                  VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected
                  Papers},
  series       = {{IFIP} Advances in Information and Communication Technology},
  volume       = {483},
  pages        = {87--108},
  publisher    = {Springer},
  year         = {2015},
  url          = {https://doi.org/10.1007/978-3-319-46097-0\_5},
  doi          = {10.1007/978-3-319-46097-0\_5},
  timestamp    = {Tue, 22 Oct 2019 15:21:19 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsi/Fujita15a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}