BibTeX record conf/vlsid/KajiharaS98

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@inproceedings{DBLP:conf/vlsid/KajiharaS98,
  author       = {Seiji Kajihara and
                  Kewal K. Saluja},
  title        = {On Test Pattern Compaction Using Random Pattern Fault Simulation},
  booktitle    = {11th International Conference on {VLSI} Design {(VLSI} Design 1991),
                  4-7 January 1998, Chennai, India},
  pages        = {464--469},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/ICVD.1998.646650},
  doi          = {10.1109/ICVD.1998.646650},
  timestamp    = {Fri, 24 Mar 2023 00:04:01 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/KajiharaS98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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