BibTeX record conf/vts/ChenMRKK01

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@inproceedings{DBLP:conf/vts/ChenMRKK01,
  author       = {John T. Chen and
                  Wojciech Maly and
                  Janusz Rajski and
                  Omar Kebichi and
                  Jitendra Khare},
  title        = {Enabling Embedded Memory Diagnosis via Test Response Compression},
  booktitle    = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
                  in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
                  {USA}},
  pages        = {292--298},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/VTS.2001.923452},
  doi          = {10.1109/VTS.2001.923452},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/ChenMRKK01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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