BibTeX record conf/vts/ChungPABW10

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@inproceedings{DBLP:conf/vts/ChungPABW10,
  author    = {Jaeyong Chung and
               Joonsung Park and
               Jacob A. Abraham and
               Eonjo Byun and
               Cheol{-}Jong Woo},
  title     = {Reducing test time and area overhead of an embedded memory array built-in
               repair analyzer with optimal repair rate},
  booktitle = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
               Santa Cruz, California, {USA}},
  pages     = {33--38},
  year      = {2010},
  crossref  = {DBLP:conf/vts/2010},
  url       = {https://doi.org/10.1109/VTS.2010.5469625},
  doi       = {10.1109/VTS.2010.5469625},
  timestamp = {Mon, 05 Jun 2017 12:41:19 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/ChungPABW10},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2010,
  title     = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
               Santa Cruz, California, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2010},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5464131},
  isbn      = {978-1-4244-6648-1},
  timestamp = {Wed, 05 Nov 2014 16:44:49 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2010},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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