BibTeX record conf/vts/LinLW12

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@inproceedings{DBLP:conf/vts/LinLW12,
  author       = {Bing{-}Yang Lin and
                  Mincent Lee and
                  Cheng{-}Wen Wu},
  title        = {A Memory Failure Pattern Analyzer for memory diagnosis and repair},
  booktitle    = {30th {IEEE} {VLSI} Test Symposium, {VTS} 2012, Maui, Hawaii, USA,
                  23-26 April 2012},
  pages        = {234--239},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/VTS.2012.6231059},
  doi          = {10.1109/VTS.2012.6231059},
  timestamp    = {Sat, 30 Sep 2023 09:58:40 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/LinLW12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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