BibTeX record conf/vts/PolianKGERB05

download as .bib file

@inproceedings{DBLP:conf/vts/PolianKGERB05,
  author       = {Ilia Polian and
                  Sandip Kundu and
                  Jean{-}Marc Galli{\`{e}}re and
                  Piet Engelke and
                  Michel Renovell and
                  Bernd Becker},
  title        = {Resistive Bridge Fault Model Evolution from Conventional to Ultra
                  Deep Submicron Technologies},
  booktitle    = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
                  Springs, CA, {USA}},
  pages        = {343--348},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/VTS.2005.72},
  doi          = {10.1109/VTS.2005.72},
  timestamp    = {Fri, 19 Apr 2024 12:17:36 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/PolianKGERB05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.