BibTeX record conf/vts/PutmanT07

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@inproceedings{DBLP:conf/vts/PutmanT07,
  author       = {Richard Putman and
                  Nur A. Touba},
  title        = {Using Multiple Expansion Ratios and Dependency Analysis to Improve
                  Test Compression},
  booktitle    = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley,
                  California, {USA}},
  pages        = {211--218},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/VTS.2007.87},
  doi          = {10.1109/VTS.2007.87},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/PutmanT07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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