BibTeX record journals/access/LiuHWGLWGH19

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@article{DBLP:journals/access/LiuHWGLWGH19,
  author       = {Tao Liu and
                  Shengdong Hu and
                  Jian{-}an Wang and
                  Gang Guo and
                  Jun Luo and
                  Yuan Wang and
                  Jingwei Guo and
                  Yanmeng Huo},
  title        = {An Investigation of Electric Field and Breakdown Voltage Models for
                  a Deep Trench Superjunction SiC {VDMOS}},
  journal      = {{IEEE} Access},
  volume       = {7},
  pages        = {145118--145123},
  year         = {2019},
  url          = {https://doi.org/10.1109/ACCESS.2019.2944991},
  doi          = {10.1109/ACCESS.2019.2944991},
  timestamp    = {Thu, 30 Jan 2020 15:32:47 +0100},
  biburl       = {https://dblp.org/rec/journals/access/LiuHWGLWGH19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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