BibTeX record journals/et/YonedaF02

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@article{DBLP:journals/et/YonedaF02,
  author    = {Tomokazu Yoneda and
               Hideo Fujiwara},
  title     = {Design for Consecutive Testability of System-on-a-Chip with Built-In
               Self Testable Cores},
  journal   = {J. Electronic Testing},
  volume    = {18},
  number    = {4-5},
  pages     = {487--501},
  year      = {2002},
  url       = {https://doi.org/10.1023/A:1016553809732},
  doi       = {10.1023/A:1016553809732},
  timestamp = {Thu, 18 May 2017 09:51:13 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/et/YonedaF02},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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