BibTeX record journals/ieiceee/LeiWLL10a

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@article{DBLP:journals/ieiceee/LeiWLL10a,
  author       = {Shaochong Lei and
                  Zhen Wang and
                  Zeye Liu and
                  Feng Liang},
  title        = {A unified solution to reduce test power and test volume for Test-per-scan
                  schemes},
  journal      = {{IEICE} Electron. Express},
  volume       = {7},
  number       = {18},
  pages        = {1364--1369},
  year         = {2010},
  url          = {https://doi.org/10.1587/elex.7.1364},
  doi          = {10.1587/ELEX.7.1364},
  timestamp    = {Fri, 12 Feb 2021 22:20:48 +0100},
  biburl       = {https://dblp.org/rec/journals/ieiceee/LeiWLL10a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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