BibTeX record journals/ieicet/YamagaMST18

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@article{DBLP:journals/ieicet/YamagaMST18,
  author       = {Yusuke Yamaga and
                  Chihiro Matsui and
                  Yukiya Sakaki and
                  Ken Takeuchi},
  title        = {Reliability Analysis of Scaled {NAND} Flash Memory Based SSDs with
                  Real Workload Characteristics by Using Real Usage-Based Precise Reliability
                  Test},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {101-C},
  number       = {4},
  pages        = {243--252},
  year         = {2018},
  url          = {https://doi.org/10.1587/transele.E101.C.243},
  doi          = {10.1587/TRANSELE.E101.C.243},
  timestamp    = {Sat, 11 Apr 2020 14:48:05 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/YamagaMST18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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