BibTeX record journals/ieicet/YuYCF08

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@article{DBLP:journals/ieicet/YuYCF08,
  author    = {Thomas Edison Yu and
               Tomokazu Yoneda and
               Krishnendu Chakrabarty and
               Hideo Fujiwara},
  title     = {Thermal-Aware Test Access Mechanism and Wrapper Design Optimization
               for System-on-Chips},
  journal   = {{IEICE} Transactions},
  volume    = {91-D},
  number    = {10},
  pages     = {2440--2448},
  year      = {2008},
  url       = {https://doi.org/10.1093/ietisy/e91-d.10.2440},
  doi       = {10.1093/ietisy/e91-d.10.2440},
  timestamp = {Sun, 28 May 2017 13:21:10 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/ieicet/YuYCF08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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