BibTeX record journals/ipsj/HigamiSTKT09

download as .bib file

@article{DBLP:journals/ipsj/HigamiSTKT09,
  author       = {Yoshinobu Higami and
                  Kewal K. Saluja and
                  Hiroshi Takahashi and
                  Shin{-}ya Kobayashi and
                  Yuzo Takamatsu},
  title        = {An Algorithm for Diagnosing Transistor Shorts Using Gate-level Simulation},
  journal      = {{IPSJ} Trans. Syst. {LSI} Des. Methodol.},
  volume       = {2},
  pages        = {250--262},
  year         = {2009},
  url          = {https://doi.org/10.2197/ipsjtsldm.2.250},
  doi          = {10.2197/IPSJTSLDM.2.250},
  timestamp    = {Tue, 29 Sep 2020 10:57:21 +0200},
  biburl       = {https://dblp.org/rec/journals/ipsj/HigamiSTKT09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics