BibTeX record journals/jcsc/AlshayebEHAEB15

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@article{DBLP:journals/jcsc/AlshayebEHAEB15,
  author       = {Mohammad R. Alshayeb and
                  Muhammad E. S. Elrabaa and
                  Ayman Hroub and
                  Amran Al{-}Aghbari and
                  Aiman H. El{-}Maleh and
                  Abdelhafid Bouhraoua},
  title        = {Towards a Test Definition Language for Integrated Circuits},
  journal      = {J. Circuits Syst. Comput.},
  volume       = {24},
  number       = {3},
  pages        = {1550027:1--1550027:19},
  year         = {2015},
  url          = {https://doi.org/10.1142/S0218126615500279},
  doi          = {10.1142/S0218126615500279},
  timestamp    = {Sat, 11 Jun 2022 13:19:49 +0200},
  biburl       = {https://dblp.org/rec/journals/jcsc/AlshayebEHAEB15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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