BibTeX record journals/mj/AlwanBKZ07

download as .bib file

@article{DBLP:journals/mj/AlwanBKZ07,
  author       = {M. Alwan and
                  B. Beydoun and
                  K. Ketata and
                  M. Zoaeter},
  title        = {Bias temperature instability from gate charge characteristics investigations
                  in N-Channel Power {MOSFET}},
  journal      = {Microelectron. J.},
  volume       = {38},
  number       = {6-7},
  pages        = {727--734},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.mejo.2007.04.015},
  doi          = {10.1016/J.MEJO.2007.04.015},
  timestamp    = {Sat, 22 Feb 2020 19:33:25 +0100},
  biburl       = {https://dblp.org/rec/journals/mj/AlwanBKZ07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics