BibTeX record journals/mr/AlaouiBTV18

download as .bib file

@article{DBLP:journals/mr/AlaouiBTV18,
  author       = {Nabil El Belghiti Alaoui and
                  Alexandre Boyer and
                  Patrick Tounsi and
                  Arnaud Viard},
  title        = {New defect detection approach using near electromagnetic field probing
                  of high density PCBAs},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {288--293},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.07.090},
  doi          = {10.1016/J.MICROREL.2018.07.090},
  timestamp    = {Sat, 22 Feb 2020 19:28:08 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AlaouiBTV18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.