BibTeX record journals/mr/BockKHGCN01

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@article{DBLP:journals/mr/BockKHGCN01,
  author       = {Karlheinz Bock and
                  Bart Keppens and
                  Vincent De Heyn and
                  Guido Groeseneken and
                  L. Y. Ching and
                  A. Naem},
  title        = {Influence of gate length on ESD-performance for deep submicron {CMOS}
                  technology},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {3},
  pages        = {375--383},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(00)00243-2},
  doi          = {10.1016/S0026-2714(00)00243-2},
  timestamp    = {Sat, 22 Feb 2020 19:27:27 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BockKHGCN01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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