BibTeX record journals/mr/GondaTBZDHE04

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@article{DBLP:journals/mr/GondaTBZDHE04,
  author       = {Viktor Gonda and
                  Jaap M. J. den Toonder and
                  Johan Beijer and
                  G. Q. Zhang and
                  Willem D. van Driel and
                  Romano J. O. M. Hoofman and
                  Leo J. Ernst},
  title        = {Prediction of thermo-mechanical integrity of wafer backend processes},
  journal      = {Microelectron. Reliab.},
  volume       = {44},
  number       = {12},
  pages        = {2011--2017},
  year         = {2004},
  url          = {https://doi.org/10.1016/j.microrel.2004.05.021},
  doi          = {10.1016/J.MICROREL.2004.05.021},
  timestamp    = {Sat, 30 Sep 2023 10:21:33 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/GondaTBZDHE04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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