BibTeX record journals/mr/HeZHW02

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@article{DBLP:journals/mr/HeZHW02,
  author       = {Jin He and
                  Xing Zhang and
                  Ru Huang and
                  Yangyuan Wang},
  title        = {Application of forward gated-diode {R-G} current method in extracting
                  {F-N} stress-induced interface traps in {SOI} NMOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {1},
  pages        = {145--148},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(01)00122-6},
  doi          = {10.1016/S0026-2714(01)00122-6},
  timestamp    = {Fri, 01 Sep 2023 09:30:35 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/HeZHW02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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