BibTeX record journals/mr/HuangWHYZW03

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@article{DBLP:journals/mr/HuangWHYZW03,
  author       = {Ru Huang and
                  Jinyan Wang and
                  Jin He and
                  Min Yu and
                  Xing Zhang and
                  Yangyuan Wang},
  title        = {Hot carrier degradation behavior in {SOI} dynamic-threshold-voltage
                  nMOSFET's (n-DTMOSFET) measured by gated-diode configuration},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {5},
  pages        = {707--711},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00038-6},
  doi          = {10.1016/S0026-2714(03)00038-6},
  timestamp    = {Fri, 01 Sep 2023 09:30:35 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/HuangWHYZW03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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