BibTeX record journals/mr/JangYWHH10

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@article{DBLP:journals/mr/JangYWHH10,
  author       = {Changsoo Jang and
                  Byeng Dong Youn and
                  Ping F. Wang and
                  Bongtae Han and
                  Suk{-}Jin Ham},
  title        = {Forward-stepwise regression analysis for fine leak batch testing of
                  wafer-level hermetic {MEMS} packages},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {4},
  pages        = {507--513},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2009.11.014},
  doi          = {10.1016/J.MICROREL.2009.11.014},
  timestamp    = {Sat, 22 Feb 2020 19:27:48 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/JangYWHH10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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