BibTeX record journals/mr/KhooTV03

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@article{DBLP:journals/mr/KhooTV03,
  author       = {Sherry Suat Cheng Khoo and
                  Pee Ya Tan and
                  Steven H. Voldman},
  title        = {Microanalysis and electromigration reliability performance of high
                  current transmission line pulse {(TLP)} stressed copper interconnects},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {7},
  pages        = {1039--1045},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00133-1},
  doi          = {10.1016/S0026-2714(03)00133-1},
  timestamp    = {Sat, 22 Feb 2020 19:27:52 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KhooTV03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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