BibTeX record journals/mr/KimASZPK10

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@article{DBLP:journals/mr/KimASZPK10,
  author       = {Hee{-}Dong Kim and
                  Ho{-}Myoung An and
                  Yujeong Seo and
                  Yongjie Zhang and
                  Jongsun Park and
                  Tae Geun Kim},
  title        = {Hydrogen passivation effects under negative bias temperature instability
                  stress in metal/silicon-oxide/silicon-nitride/silicon-oxide/silicon
                  capacitors for flash memories},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {1},
  pages        = {21--25},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2009.09.008},
  doi          = {10.1016/J.MICROREL.2009.09.008},
  timestamp    = {Sat, 22 Feb 2020 19:26:44 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KimASZPK10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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