BibTeX record journals/mr/LaiYY08

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@article{DBLP:journals/mr/LaiYY08,
  author       = {Yi{-}Shao Lai and
                  Po{-}Chuan Yang and
                  Chang{-}Lin Yeh},
  title        = {Effects of different drop test conditions on board-level reliability
                  of chip-scale packages},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {2},
  pages        = {274--281},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2007.03.005},
  doi          = {10.1016/J.MICROREL.2007.03.005},
  timestamp    = {Sat, 22 Feb 2020 19:28:57 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LaiYY08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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