BibTeX record journals/mr/RuprechtBH03

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@article{DBLP:journals/mr/RuprechtBH03,
  author       = {Michael W. Ruprecht and
                  Guenther Benstetter and
                  Douglas B. Hunt},
  title        = {A review of {ULSI} failure analysis techniques for DRAMs. Part {II:}
                  Defect isolation and visualization},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {1},
  pages        = {17--41},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(02)00295-0},
  doi          = {10.1016/S0026-2714(02)00295-0},
  timestamp    = {Wed, 07 Dec 2022 23:04:38 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RuprechtBH03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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