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BibTeX record journals/mr/SchwalkeS05
@article{DBLP:journals/mr/SchwalkeS05, author = {Udo Schwalke and Yordan Stefanov}, title = {Process integration and nanometer-scale electrical characterization of crystalline high-k gate dielectrics}, journal = {Microelectron. Reliab.}, volume = {45}, number = {5-6}, pages = {790--793}, year = {2005}, url = {https://doi.org/10.1016/j.microrel.2004.11.047}, doi = {10.1016/J.MICROREL.2004.11.047}, timestamp = {Sat, 22 Feb 2020 19:27:47 +0100}, biburl = {https://dblp.org/rec/journals/mr/SchwalkeS05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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