BibTeX record journals/mr/SemenovOS04

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@article{DBLP:journals/mr/SemenovOS04,
  author       = {Oleg Semenov and
                  Michael S. Obrecht and
                  Manoj Sachdev},
  title        = {Evaluation of {STI} degradation using temperature dependence of leakage
                  current in parasitic {STI} {MOSFET}},
  journal      = {Microelectron. Reliab.},
  volume       = {44},
  number       = {9-11},
  pages        = {1751--1755},
  year         = {2004},
  url          = {https://doi.org/10.1016/j.microrel.2004.07.068},
  doi          = {10.1016/J.MICROREL.2004.07.068},
  timestamp    = {Fri, 08 Apr 2022 11:01:24 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/SemenovOS04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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