BibTeX record journals/mr/Stojcev03b

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@article{DBLP:journals/mr/Stojcev03b,
  author       = {Mile K. Stojcev},
  title        = {Semiconductor Memories: Technologies, Testing and Reliability; Ashok
                  K. Sharma. {IEEE} Press and Wiley Interscience, New York, 1997. Hardcover,
                  pp 462, plus XII, {ISBN} 0-7803-1000-4},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {3},
  pages        = {515},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00002-7},
  doi          = {10.1016/S0026-2714(03)00002-7},
  timestamp    = {Sat, 22 Feb 2020 19:29:19 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Stojcev03b.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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