BibTeX record journals/mr/UsuiSIMSA02

download as .bib file

@article{DBLP:journals/mr/UsuiSIMSA02,
  author       = {Masanori Usui and
                  Takahide Sugiyama and
                  Masayasu Ishiko and
                  Jun Morimoto and
                  Hirokazu Saitoh and
                  Masaki Ajioka},
  title        = {Characterization of Trench {MOS} Gate Structures Utilizing Photon
                  Emission Microscopy},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {9-11},
  pages        = {1647--1652},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00204-4},
  doi          = {10.1016/S0026-2714(02)00204-4},
  timestamp    = {Sat, 22 Feb 2020 19:29:31 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/UsuiSIMSA02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics