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BibTeX record journals/mva/DomB95
@article{DBLP:journals/mva/DomB95, author = {Byron Dom and Virginia H. Brecher}, title = {Recent advances in the automatic inspection of integrated circuits for pattern defects}, journal = {Mach. Vis. Appl.}, volume = {8}, number = {1}, pages = {5--19}, year = {1995}, url = {https://doi.org/10.1007/BF01213634}, doi = {10.1007/BF01213634}, timestamp = {Wed, 17 May 2017 14:25:41 +0200}, biburl = {https://dblp.org/rec/journals/mva/DomB95.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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