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BibTeX record journals/qre/WangC20a
@article{DBLP:journals/qre/WangC20a, author = {Rui Wang and Nan Chen}, title = {Defect pattern recognition on wafers using convolutional neural networks}, journal = {Qual. Reliab. Eng. Int.}, volume = {36}, number = {4}, pages = {1245--1257}, year = {2020}, url = {https://doi.org/10.1002/qre.2627}, doi = {10.1002/QRE.2627}, timestamp = {Wed, 31 Mar 2021 17:43:20 +0200}, biburl = {https://dblp.org/rec/journals/qre/WangC20a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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