BibTeX record journals/qre/WangC20a

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@article{DBLP:journals/qre/WangC20a,
  author       = {Rui Wang and
                  Nan Chen},
  title        = {Defect pattern recognition on wafers using convolutional neural networks},
  journal      = {Qual. Reliab. Eng. Int.},
  volume       = {36},
  number       = {4},
  pages        = {1245--1257},
  year         = {2020},
  url          = {https://doi.org/10.1002/qre.2627},
  doi          = {10.1002/QRE.2627},
  timestamp    = {Wed, 31 Mar 2021 17:43:20 +0200},
  biburl       = {https://dblp.org/rec/journals/qre/WangC20a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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