BibTeX record journals/tcad/CaoVSCAEBF14

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@article{DBLP:journals/tcad/CaoVSCAEBF14,
  author       = {Yu Cao and
                  Jyothi Velamala and
                  Ketul Sutaria and
                  Mike Shuo{-}Wei Chen and
                  Jonathan Ahlbin and
                  Ivan Sanchez Esqueda and
                  Michael Bajura and
                  Michael Fritze},
  title        = {Cross-Layer Modeling and Simulation of Circuit Reliability},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {33},
  number       = {1},
  pages        = {8--23},
  year         = {2014},
  url          = {https://doi.org/10.1109/TCAD.2013.2289874},
  doi          = {10.1109/TCAD.2013.2289874},
  timestamp    = {Thu, 15 Apr 2021 16:06:39 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/CaoVSCAEBF14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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