BibTeX record journals/tcyb/BaekK17

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@article{DBLP:journals/tcyb/BaekK17,
  author       = {Sujeong Baek and
                  Duck Young Kim},
  title        = {Empirical Sensitivity Analysis of Discretization Parameters for Fault
                  Pattern Extraction From Multivariate Time Series Data},
  journal      = {{IEEE} Trans. Cybern.},
  volume       = {47},
  number       = {5},
  pages        = {1198--1209},
  year         = {2017},
  url          = {https://doi.org/10.1109/TCYB.2016.2540657},
  doi          = {10.1109/TCYB.2016.2540657},
  timestamp    = {Fri, 22 May 2020 13:31:07 +0200},
  biburl       = {https://dblp.org/rec/journals/tcyb/BaekK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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