BibTeX record journals/technometrics/MeekerEH09

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@article{DBLP:journals/technometrics/MeekerEH09,
  author       = {William Q. Meeker and
                  Luis A. Escobar and
                  Yili Hong},
  title        = {Using Accelerated Life Tests Results to Predict Product Field Reliability},
  journal      = {Technometrics},
  volume       = {51},
  number       = {2},
  pages        = {146--161},
  year         = {2009},
  url          = {https://doi.org/10.1198/TECH.2009.0016},
  doi          = {10.1198/TECH.2009.0016},
  timestamp    = {Wed, 06 Jun 2018 09:15:50 +0200},
  biburl       = {https://dblp.org/rec/journals/technometrics/MeekerEH09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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