BibTeX record journals/technometrics/TianMMH17

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@article{DBLP:journals/technometrics/TianMMH17,
  author       = {Ye Tian and
                  Ranjan Maitra and
                  William Q. Meeker and
                  Stephen D. Holland},
  title        = {A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive
                  Evaluation Images},
  journal      = {Technometrics},
  volume       = {59},
  number       = {2},
  pages        = {247--261},
  year         = {2017},
  url          = {https://doi.org/10.1080/00401706.2016.1153000},
  doi          = {10.1080/00401706.2016.1153000},
  timestamp    = {Wed, 14 Nov 2018 10:34:04 +0100},
  biburl       = {https://dblp.org/rec/journals/technometrics/TianMMH17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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