BibTeX record journals/todaes/LeeH13

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@article{DBLP:journals/todaes/LeeH13,
  author       = {Yu{-}Min Lee and
                  Pei{-}Yu Huang},
  title        = {An efficient method for analyzing on-chip thermal reliability considering
                  process variations},
  journal      = {{ACM} Trans. Design Autom. Electr. Syst.},
  volume       = {18},
  number       = {3},
  pages        = {41:1--41:32},
  year         = {2013},
  url          = {https://doi.org/10.1145/2491477.2491485},
  doi          = {10.1145/2491477.2491485},
  timestamp    = {Tue, 06 Nov 2018 12:51:48 +0100},
  biburl       = {https://dblp.org/rec/journals/todaes/LeeH13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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