BibTeX record journals/tr/TsengBT09

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@article{DBLP:journals/tr/TsengBT09,
  author    = {Sheng{-}Tsaing Tseng and
               Narayanaswamy Balakrishnan and
               Chih{-}Chun Tsai},
  title     = {Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation
               Processes},
  journal   = {{IEEE} Trans. Reliability},
  volume    = {58},
  number    = {4},
  pages     = {611--618},
  year      = {2009},
  url       = {https://doi.org/10.1109/TR.2009.2033734},
  doi       = {10.1109/TR.2009.2033734},
  timestamp = {Fri, 26 May 2017 22:53:14 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tr/TsengBT09},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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